Transient Measurement Unit (TMU)
IV, TPV, TPC, CE, (Photo-)CELIV - Semiconductor characterization for thin film solar cells
Measurement Modes
- IV – Steady state Current-Voltage characteristics
- TPV / TPC – Transient Photo Voltage / Current
- CE – Charge Extraction
- (Photo-)CELIV – Charge Extraction by Linearly Increasing Voltage
Enabling the customer to determine values for charge carrier lifetime, density and mobility of thin film devices.
Applications
- Semiconductor characterization
- Measurement of every relevant solar cell parameter
- Know your device limitations – Improve your devices
- Study ageing behavior
Key features
- Customized sample holders
- Glovebox integration possible
- Parameter extraction software modules
- Modular setup using high quality instruments
- Software controlled switching between measurement modes and contacts
- Sample excitation with laser pulses ≥ 20 ns
- Selectable laser (405nm, 520nm, 635nm, 785nm) up to 100 mW
- Power-LED backlight (up to 2000 W/m²)
- Voltage range: +/- 21 V
- Parameter extraction software modules
- Database integration possible
See also
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Consumables
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You need a customized solution?
Feel free to contact us!
Options
| Art. No. | Description |
|---|---|
| TMU | Transient Measurement Unit |
| OB | Optical box size 600x450x300 mm3 for high flexibility |
| SOB | Small optical box 250x250x500 mm³ for glovebox integration |
| X-Lyyy-zz mW | Laser diode No. X with wavelength yyy nm and zz mW maximum power (Laser No.1 is the main laser – up to 3 lasers possible) |
| MP | Multiplexer for automatic measurements of substrates with more than 1 contact – 8 channels standard |
| EC | Environmental chamber for keeping the sample in nitrogen atmosphere during measurement. Maximum sample size 75×75 mm². |
| ECQG | Environmental chamber with quartz glass window |
