LBIC-PL-EL - Automatic Research

LBIC-PL-EL Setups

Fast and reliable photocurrent mapping with highest resolution
In-depth defect detection, visualization and identification – shunts, coating defects, localize inactive regions
Study degradation effects
Quality control tool
A laser beam scans the sample and the excited photocurrent is measured and the spectrally resolved luminescence is simultaneously detected
Electrical excitation for electroluminescence measurements
Different (multiple) laser wavelengths available
Up to 300×300 mm² scanning area
Mapping of all kinds of solar technologies: Perovskite, Organic, Silicon, CIGS, CdTE, …

Different laser choices
Laser check for beam circularity
Versatile sample holder
Easy to use control software with data export
Different detector options for luminescence measurements, optimized to application and budget

Art. No.	Description
PL	PL Upgrade – high quality detector system optimized for each application from 200-1700 nm
EL	EL Upgrade (PL option required)
FC	Fiber bundle connector for using the detector system with other inputs

Art. No.	Description
LBIC	LBIC system with optical isolator for laser protection
X-Lyyy-zz mW	Laser No. X with wavelength yyy nm and zz mW maximum power (laser No. 1 is main laser – up to 3 lasers possible)
LC	Laser check for beam circularity
HR	High resolution option – 10x magnification objective
PM	Power meter for measuring and observing the laser intensity during measurement
MP	Multiplexer for automatic measurements of substrates with more than 1 contact – 8 channels standard
EC	Environmental chamber to keep the sample in nitrogen atmosphere during measurement. Maximum sample size 50×50 mm²
ECQG	Environmental chamber with quartz glass window (recommended for PL/EL)
SA50	50×50 mm² scan area
SA100	100×100 mm² scan area
SA150	150×150 mm² scan area
SA300	300×300 mm² scan area